About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Compressing digital panoramic images can affect their diagnostic quality and the ability to evaluate certain anatomical structures, according to a study in Clinical Oral Investigations (July 6, 2011).

Applications like as smart cards and devices used in the defense industry require security to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement met ...

Learn more about objective quality metrics at Streaming Media West. Read the transcript of this clip: Jan Ozer: If you want to do a standards-based analysis of any kind of video comparison, there are ...