Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

The semiconductor chips driving modern-day computer processors are covered in billions of individual transistors, each of which can overheat under stress, causing steep drops in performance. To ...

Current copper wiring in computer chips struggles to carry electricity efficiently as circuits shrink to the nanoscale, leading to a process that generates heat and limits performance. These materials ...